Soft Error Reliability of VLSI Circuits

Discover the cutting-edge insights in "Soft Error Reliability of VLSI Circuits" by Behnam Ghavami, published by Springer Nature Switzerland AG in 2021. This essential paperback edition, spanning 114 pages, delves into innovative Soft Error Rate (SER) analysis techniques. The book covers advanced topics including process variation-aware SER estimation and GPU-accelerated SER analysis methods. Additionally, readers will explore effective SER reduction strategies such as gate sizing and logic restructuring based SER techniques. Ideal for engineers and researchers in the field of VLSI design, this comprehensive guide provides the tools necessary to enhance circuit reliability in the face of soft errors. Elevate your understanding of VLSI circuits today!