On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond

Discover cutting-edge solutions for accurate mm-wave characterization of advanced semiconductor devices in On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond by Andrej Rumiantsev. Published in 2019 by River Publishers, this insightful hardback spans 278 pages, making it an essential resource for engineers and researchers in the field of semiconductors.

This book meticulously guides readers through the development, implementation, and verification of in-situ calibration methods specifically optimized for high-performance silicon technologies. With its comprehensive approach, it addresses the challenges faced in the characterization of devices operating at mm-wave frequencies and beyond, ensuring accuracy and reliability in results.

Whether you are a seasoned professional or a newcomer to the semiconductor industry, Rumiantsev's expertise will equip you with the knowledge needed to enhance your understanding and application of on-wafer calibration techniques.