On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond

Discover cutting-edge solutions for the accurate characterization of advanced semiconductor devices with On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond by River Publishers. Published in 2024, this comprehensive guide spans 278 pages and delves into the development, implementation, and verification of in-situ calibration methods tailored for high-performance silicon technologies. Ideal for professionals and researchers in the field, this book provides essential insights into mm-wave characterization, making it a valuable addition to your technical library. Enhance your understanding of semiconductor device performance with this authoritative resource.