Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156

Discover the essential insights in "Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156," published by the Materials Research Society. This comprehensive volume, consisting of 189 pages, compiles the proceedings from Symposium D held in San Francisco, California, in 2009. It serves as an invaluable resource for researchers and practitioners in the fields of integrated circuits, microelectronics, and nanoelectronics.

Delve into the latest advancements in materials and processes that enhance the reliability of advanced interconnects crucial for very large scale integration. This hardback edition is a must-have for anyone looking to stay at the forefront of technology in interconnects and integrated circuit technology. Equip yourself with the knowledge and research findings that shape the future of micro- and nanoelectronics.