Introduction to Scanning Tunneling Microscopy

Discover the fascinating world of nanotechnology with Introduction to Scanning Tunneling Microscopy by C. Julian Chen. Published by Oxford University Press in 2015, this 2nd revised edition spans an impressive 488 pages and serves as an essential resource for both newcomers and seasoned professionals in the field.

This comprehensive guide delves into the principles and applications of scanning tunneling and atomic force microscopy, techniques that earned the Physics Nobel Prize in 1986 for their groundbreaking ability to image individual atoms. Since its first edition in 1993, this book has been a vital reference, nurturing countless individuals in their understanding of nanotechnology.

Whether you are a student, researcher, or industry expert, this updated edition is designed to enhance your knowledge and skills, making it a must-have addition to your scientific library.