Handbook of Charged Particle Optics

Discover the essential resource for mastering high-resolution probe instrumentation with the Handbook of Charged Particle Optics by Jon Orloff. Published by Taylor & Francis Inc in 2008, this comprehensive guide spans 686 pages and is now in its 2nd edition. This handbook provides invaluable insights into the design and operation of high-resolution focused probe instruments, making it an indispensable tool for professionals and researchers in the fields of laser technology, optics, and photonics. Dive into detailed chapters covering crucial topics such as aberration correction and the applications of gas phase field ionization sources. Whether you are a seasoned expert or a newcomer to the field, this book will enhance your understanding and application of charged particle optics, positioning you at the forefront of technology and engineering advancements.