Digital Holography for MEMS and Microsystem Metrology

Explore the cutting-edge world of digital holography with Digital Holography for MEMS and Microsystem Metrology by Anand Asundi. Published by John Wiley & Sons Inc in 2011, this hardback edition spans 228 pages and serves as a comprehensive guide to the industrial inspection of digital holography. The book delves into the practical applications of digital holography for characterizing Microelectromechanical Systems (MEMS), measuring residual stress, and evaluating device designs. With a focus on holographic testing and image processing, this essential resource is perfect for professionals and researchers in the fields of measurement and microelectronics. Discover how this innovative technology can enhance your understanding of microsystem metrology and improve device testing and inspection methods.