• Book cover of: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Sandeep K. (TSMC Technology Inc., San Jose, California, USA) Goel

€267,75
€267,75 €276,50 Myynti

Meillä on varastossa

Prekės šiuo metu neturime
Palikite el. paštą ir pranešime iškart, kai prekė vėl atsiras sandėlyje.
Kalba Anglų k.
Leidimo metai 2013 m.
Puslapių skč. 259 psl.
Viršelis Kietas viršelis
ISBN 9781439829417

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits by Krishnendu Chakrabarty, Sandeep K. Goel.

Published by CRC Press, (2012), Hardback, 259 pages.

Topics: Metal oxide semiconductors, complementary, Nanotechnology, Complementary Metal oxide semiconductors.

Book cover of: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Testing for Small-Delay Defects in Na...

€267,75
€267,75 €276,50