Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Name: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Brand: Bookshop
SKU: 9781439829417
Price: 221.00 EUR
Availability: InStock

Devices, Circuits, and Systems

€221,00 €287,30

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2013 m.

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Viivakoodi: 9781439829417

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

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