Optical Metrology
Tietoa kirjasta
Discover the fascinating world of optical technologies with Optical Metrology, authored by experts in the field and published by John Wiley & Sons Inc in 2002. This comprehensive third edition spans 392 pages and delves into advanced topics such as computerized optical processes, ray tracing, and the Fourier transform. You'll also explore the intricacies of Bibre-Bragg sensors and temporal phase unwrapping.
The book provides an in-depth discussion on lasers and their principles, making it an essential resource for understanding radiometry and photometry. Additionally, it covers the functionality of CCD cameras, offering valuable insights for both students and professionals in optical metrology. Enhance your knowledge and stay ahead in this evolving field with this indispensable reference.
| Kirjoittaja | Kjell J. (Spectra Vision AS, Trondheim, Norway) Gasvik |
|---|---|
| Kustantaja | John Wiley & Sons Inc |
| Julkaistu | 2002 m. |
| Kieli | Englanti |
| Sivumäärä | 392 psl. |
| Sidosasu | Kovakantinen |
| Painos | 3 ed |
| ISBN | 9780470843000 |