Characterisation of Radiation Damage by Transmission Electron Microscopy

Explore the intricate world of radiation damage with "Characterisation of Radiation Damage by Transmission Electron Microscopy" by M.L Jenkins. Published by Taylor & Francis Ltd in 2000, this comprehensive hardback edition spans 234 pages and delves into advanced electron microscopy techniques. Jenkins meticulously details the methods employed to investigate complex microstructures resulting from fast-particle irradiation of metals and ion implantation in semiconductors. This essential resource also highlights techniques for characterizing small point-defect clusters, including dislocation loops. Perfect for professionals and researchers in material science and microscopy, this book is an invaluable addition to your library. Enhance your understanding of the physical properties of materials and the effects of radiation on them with this authoritative guide.