Thin Film Analysis by X-Ray Scattering
Kirjan tiedot
| Kirjoittaja | Mario Birkholz |
|---|---|
| Kustantaja | Wiley-VCH Verlag GmbH |
| Julkaistu | 2005 m. |
| Kieli | Englanti |
| Sivumäärä | 378 psl. |
| Sidosasu | Kovakantinen |
| Genre | Menas ir dizainas |
| ISBN | 9783527310524 |
Tietoa kirjasta
Explore the cutting-edge realm of materials science with Thin Film Analysis by X-Ray Scattering by Mario Birkholz. Published by Wiley-VCH Verlag GmbH in 2005, this comprehensive hardback spans 378 pages and delves into the pivotal role of thin films in modern technology. Enhanced by contributions from experts Paul F. Fewster and Christoph Genzel, this book provides an in-depth examination of X-ray diffraction techniques tailored for thin films, a vital area of study in today's high-tech applications. Whether you're a student, researcher, or industry professional, this resource offers essential insights into the evolving landscape of material science. Elevate your understanding of thin film technology and its applications with this indispensable guide.