Quantitative X-Ray Spectrometry
Kirjan tiedot
| Kirjoittaja | Ron Jenkins |
|---|---|
| Kustantaja | Taylor & Francis Inc |
| Julkaistu | 1995 m. |
| Kieli | Englanti |
| Sivumäärä | 504 psl. |
| Sidosasu | Kovakantinen |
| Painos | 2 ed |
| ISBN | 9780824795542 |
Tietoa kirjasta
Discover the essential guide to X-ray spectrometry in "Quantitative X-Ray Spectrometry," authored by experts in the field and published by Taylor & Francis Inc. This comprehensive 2nd edition, released in 1995, spans 504 pages and delves into crucial aspects of X-ray spectrometry, covering everything from fundamental principles to the intricate details of instrument parameter selection and sample preparation.
This authoritative text also explores the innovative use of combined X-ray fluorescence and X-ray diffraction data, highlighting its fresh applications in diverse fields such as environmental studies, forensic science, minerals and ore analysis, and ceramic materials. Whether you're a seasoned professional or a student looking to deepen your knowledge, this book is an invaluable resource for anyone interested in the practical applications of X-ray spectrometry.