{"product_id":"testing-for-small-delay-defects-in-nanoscale-cmos-integrated-circuits-taylor-francis-ltd-9781138075771-sandeep-k-goel","title":"Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits","description":"\u003cp\u003e\u003cstrong\u003eTesting for Small-Delay Defects in Nanoscale CMOS Integrated Circuits\u003c\/strong\u003e by Krishnendu Chakrabarty, Sandeep K. Goel.\u003c\/p\u003e\n\u003cp\u003ePublished by Taylor \u0026amp; Francis Group, (2017), Paperback, 264 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Metal oxide semiconductors, complementary, Nanotechnology, Complementary Metal oxide semiconductors.\u003c\/p\u003e","brand":"Sandeep K. Goel","offers":[{"title":"Default Title","offer_id":52226813067606,"sku":"9781138075771","price":105.48,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781138075771.jpg?v=1767740698","url":"https:\/\/www.englishbook.fi\/products\/testing-for-small-delay-defects-in-nanoscale-cmos-integrated-circuits-taylor-francis-ltd-9781138075771-sandeep-k-goel","provider":"Bookshop","version":"1.0","type":"link"}