{"product_id":"handbook-of-silicon-semiconductor-metrology-taylor-francis-inc-9780824705060-alain-c-diebold","title":"Handbook of Silicon Semiconductor Metrology","description":"\u003cp\u003eContaining more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, overlay, and dopant dose.\u003c\/p\u003e","brand":"Alain C. Diebold","offers":[{"title":"Default Title","offer_id":52242091934038,"sku":"9780824705060","price":448.62,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780824705060.jpg?v=1767764656","url":"https:\/\/www.englishbook.fi\/products\/handbook-of-silicon-semiconductor-metrology-taylor-francis-inc-9780824705060-alain-c-diebold","provider":"Bookshop","version":"1.0","type":"link"}