{"product_id":"characterization-of-high-tc-materials-and-devices-by-electron-microscopy-cambridge-university-press-9780521031707","title":"Characterization of High Tc Materials and Devices by Electron Microscopy","description":"\u003cp\u003eThis is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.\u003c\/p\u003e","brand":"Bookshop","offers":[{"title":"Default Title","offer_id":52250276462934,"sku":"9780521031707","price":53.35,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780521031707.jpg?v=1767777251","url":"https:\/\/www.englishbook.fi\/products\/characterization-of-high-tc-materials-and-devices-by-electron-microscopy-cambridge-university-press-9780521031707","provider":"Bookshop","version":"1.0","type":"link"}